EMI-inducted failures in MOS power transistors

TitoloEMI-inducted failures in MOS power transistors
Publication TypeConference Paper
Year of Publication2009
AuthorsBona, C., and F. Fiori
Conference NameInternational Conference on Electromagnetics in Advanced Applications (ICEAA '09)
Date Published09/2009
Keywordsdrain terminal, electromagnetic interference, electromagnetic wave interference, EMI-inducted failures, failure analysis, low-side configuration, MOS power transistors, power MOSFET, semiconductor device models, semiconductor device testing, small-signal models, susceptibility levels, time domain simulations, time-domain analysis
DOI10.1109/ICEAA.2009.5297367