A new refinement criterion for adaptive sampling in path tracing

TitoloA new refinement criterion for adaptive sampling in path tracing
Publication TypeConference Paper
Year of Publication2010
AuthorsXu, Q., M. Sbert, M. Feixas, and R. Scopigno
Conference NameIndustrial Electronics (ISIE), 2010 IEEE International Symposium on
Date Published07/2010
Keywordsadaptive sampling, entropy, gradient methods, homogeneity measurement, image denoising, image sampling, interpixel information, intrapixel information, Monte Carlo methods, Monte Carlo noise, nonextensive Tsallis entropy, parallel processing, path tracing, refinement criterion, SIMD parallelism, spatial gradient
DOI10.1109/ISIE.2010.5636310
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