Using ER Models for Microprocessor Functional Test Coverage Evaluation

TitoloUsing ER Models for Microprocessor Functional Test Coverage Evaluation
Publication TypeConference Paper
Year of Publication2008
AuthorsBenso, A., S. Di Carlo, P. Prinetto, A. Savino, and A. Scionti
Conference Name11th IEEE Baltic Electronic Conference (BEC)
Conference LocationTallinn, Estonia