Influence of Parasitic Capacitance Variation on 65 nm and 32 nm Predictive Technology Model SRAM Core-Cells

TitleInfluence of Parasitic Capacitance Variation on 65 nm and 32 nm Predictive Technology Model SRAM Core-Cells
Publication TypeConference Paper
Year of Publication2008
AuthorsDi Carlo, S., P. Prinetto, A. Savino, and A. Scionti
Conference Name17th IEEE Asian Test Sympsosium (ATS)
Date Published11/2008
Conference LocationSapporo, Japan