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Di Carlo, S., P. Prinetto, A. Savino, and A. Scionti, "Influence of Parasitic Capacitance Variation on 65 nm and 32 nm Predictive Technology Model SRAM Core-Cells", 17th IEEE Asian Test Sympsosium (ATS), Sapporo, Japan, 11/2008.
Di Carlo, S., M. Falasconi, E. Sanchez, A. Scionti, G. Squillero, and A. Tonda, "Increasing pattern recognition accuracy for chemical sensing by evolutionary based drift compensation", Pattern Recognition Letters, vol. 32, issue 13: Elsevier B.V., pp. 1594-1603, 2011.