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Filters: Autore is Vipiana, F. and First Letter Of Keyword is E  [Clear All Filters]
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eigenfrequency
Francavilla, M. A., F. Vipiana, L. Li, and G. Vecchi, "An Automatic Dual-Surface Approach for the Solution of the Electric Field Boundary Integral Equation in Presence of Interior Resonances", IEEE International Symposium on Antennas and Propagation (APSURSI), Spokane, WA - USA, pp. 3207 -3210, 07/2011.
EFIE-MoM matrix
Vipiana, F., P. Pirinoli, and G. Vecchi, "Regularization effect of a multi-resolution basis on the EFIE-MoM matrix", Antennas and Propagation Society International Symposium, 2005 IEEE, vol. 3B, pp. 192 - 195 vol. 3B, july, 2005.
EFIE-MoM approach
Pirinoli, P., F. Vipiana, and G. Vecchi, "Multiresolution MoM: a multi-grid approach", Antennas and Propagation Society International Symposium, 2004. IEEE, vol. 1, pp. 359 - 362 Vol.1, june, 2004.
EFIE-MoM analysis
Vipiana, F., G. Vecchi, P. Pirinoli, and L. Matekovits, "Coarsest-mesh issues in multiresolution integral-equation analysis of antennas", Antennas and Propagation Society International Symposium, 2002. IEEE, vol. 2, pp. 622 - 625 vol.2, 2002.
EFIE-MoM
Vipiana, F., P. Pirinoli, and G. Vecchi, "Wavelet-MoM analysis of 3D antennas with triangular mesh", Antennas and Propagation Society International Symposium, 2004. IEEE, vol. 2, pp. 1471 - 1474 Vol.2, june, 2004.
EFIE MoM matrix
Francavilla, M. A., F. Vipiana, S. Arianos, and G. Vecchi, "Multilevel Domain Differentiated Analysis of Large Multi-Scale Structures Inside the HIRF-SE Framework", International Conference on Electromagnetics in Advanced Applications (ICEAA), Turin, Italy, pp. 944 -946, 09/2011.
EFIE
Vipiana, F., G. Vecchi, and D. R. Wilton, "A Multi-Resolution basis for the analysis of wire-surface structures", Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE, pp. 1 -4, 06/2009.
Francavilla, M. A., F. Vipiana, and G. Vecchi, "FFT-based solvers for the EFIE on graphics processors", Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE, Toronto, Canada, pp. 1 -4, 07/2010.

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